Non-volatile memory with test rows for disturb detection

ABSTRACT

A non-volatile memory device has an array of memory cells arranged in rows and columns. The memory cells can be externally accessed for programming, erasing and reading operations. Test rows of memory cells are provided in the array to allow for memory cell disturb conditions. The test rows are not externally accessible for standard program and read operations. The test rows are located near bit line driver circuitry to insure the highest exposure to bit line voltages that may disturb memory cells in the array.

TECHNICAL FIELD OF THE INVENTION

The present invention relates generally to memory devices and inparticular the present invention relates to non-volatile memory devicesand leakage detection.

BACKGROUND OF THE INVENTION

Electrically erasable and programmable read only memories (EEPROMs) arereprogrammable non-volatile memories that are widely used in computersystems for storing data. The typical data storage element of an EEPROMis a floating gate transistor, which is a field-effect transistor (FET)having an electrically isolated (floating) gate that controls electricalconduction between source and drain regions. Data is represented bycharge stored on the floating gate and the resulting conductivityobtained between source and drain regions.

For example, a floating gate memory cell can be formed in a P-typesubstrate with an N-type diffused source region and an N-type draindiffusion formed in the substrate. The spaced apart source and drainregions define an intermediate channel region. A floating gate,typically made of doped polysilicon, is located over the channel regionand is electrically isolated from the other cell elements by oxide. Forexample, a thin gate oxide can be located between the floating gate andthe channel region. A control gate is located over the floating gate andcan also be made of doped polysilicon. The control gate is separatedfrom the floating gate by a dielectric layer.

To program a memory cell, a high positive voltage Vg, such as +12 volts,is applied to the control gate of the cell. In addition, a moderatepositive voltage of about +6 to +9 volts is applied to the drain (Vd)and the source voltage (Vs) is at ground level, as is a substratevoltage (Vsub). In prior memories, the current requirements for the +12volts applied to the control gate and the +6 to +9 volts applied to thedrain region are relatively small. This is due in large part to the factthat only a few flash cells are ever programmed at one time; thus, thesevoltages can be generated on the integrated circuit utilizing chargepump circuitry that is powered by the primary supply voltage Vcc. Theabove voltage ranges are based upon the assumption that the primarysupply voltage Vcc for the memory is +5 volts.

The above conditions result in the inducement of hot electron injectionin the channel region near the drain region of the memory cell. Thesehigh-energy electrons travel through the thin gate oxide towards thepositive voltage present on the control gate and collect on the floatinggate. The electrons remain on the floating gate and function to increasethe effective threshold voltage of the cell as compared to a cell thathas not been programmed. The memory cells can be erased to remove thefloating gate charge. Erase operations are typically performedsimultaneously on a block of memory cells of a flash memory device.During an erase operation, one of the blocks is selected. In oneembodiment, the un-selected blocks remain coupled to common bit lines,the unselected blocks are subjected to the erase voltage coupled to theselected bit line. These erase voltages can disturb the memory cells inthe un-selected blocks. A time consuming process of checking the memorycells in the un-selected blocks is typically performed to identify cellsthat required repair.

Further, as memory cell population densities increase, the physicalspace allocated to device components decreases. For example, bit linesused to couple memory cells located in a column of the memory device mayincrease in length and decrease in width. These changes in the bit linesresult in an increased resistance for the bit line. As such, programmingspeeds of some memory cells may increase as a result of slowerpropagation times. Further, bit line driver circuits must be able toprovide higher program voltages to overcome the increased voltage dropalong bit lines as a result of the increased resistance.

During an erase operation, the gate is grounded or brought to a negativevoltage, while the source is brought to a high voltage, such as 6 or 10volts. The drain of the cells is left floating and will typically go toa voltage around 3 volts due to source to drain leakage. In anotherembodiment, often called “channel erase” (as opposed to “source erase”described above), the gate is brought negative while the source, thesubstrate of the cell and/or the drain are brought high. In this case,the drain, or bit line voltage will be at the same value as the source,about 6 volts.

In both cases, the bit lines will be at a positive voltage. In a memorywhere common bit lines are shared across erase blocks, this positivevoltage will create a disturb situation. In this disturb situation,memory cells in an un-selected block see 3 to 6 volts on their drain,while their source and gate are grounded. This condition, called draindisturb, results in a lowering of cell threshold voltage of thedisturbed cells which affects the data stored in the cells if the datastored was a “0” (programmed state).

A similar condition appears during a program operation, where the bitline will be at 6V, and therefore the cells sharing this bit line inunselected blocks will have their drains at 6V, and their sources andgates grounded. During a program operation the cells located closest tothe data driver will see the highest drain voltage since the voltagedrop from the data driver to cells is least. During an erase operationno current flows in the bit lines, so the drain voltage will be similaron all cells.

For the reasons stated above, and for other reasons stated below whichwill become apparent to those skilled in the art upon reading andunderstanding the present specification, there is a need in the art fora disturb detection in a non-volatile memory device.

SUMMARY OF THE INVENTION

The above-mentioned problems with memory devices and other problems areaddressed by the present invention and will be understood by reading andstudying the following specification.

In one embodiment, a non-volatile memory device comprises an array ofnon-volatile memory cells arranged in rows and columns, a plurality ofbit lines coupled to the non-volatile memory cells, a driver circuitcoupled to the plurality of bit line, and test rows coupled to the arrayand located near the driver circuit.

In another embodiment, a flash memory device comprises an array offloating gate non-volatile memory cells arranged in rows and columns, abit line coupled to the non-volatile memory cells, and first and seconddriver circuits respectively coupled to first and second end regions ofthe bit line. A decoder circuit is provided to selectively couple thefirst and second driver circuits to the bit line. First and second setsof addressable memory cell test rows are coupled to the array andrespectively located near the first and second driver circuits.

A method of erasing memory cells in a non-volatile memory device isprovided. The method comprises initiating an erase operation on memorycells located in a first part of an addressable array of memory cells,and performing a disturb test operation on test rows to forecast ifmemory cells located in a second part of the addressable array of memorycells were disturbed during the erase operation.

Another method of operating a non-volatile memory system comprisesinitiating an erase operation on memory cells located in a first blockof an array of memory cells of a memory device in response toinstructions from an external processor, performing a disturb testoperation on test rows to forecast if memory cells located in additionalblocks of the array were disturbed during the erase operation, andperforming a data recovery operation on the memory cells located in theadditional blocks of the array based upon the disturb test operation.

The invention further provides methods and apparatus of varying scope.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of a memory of one embodiment of the presentinvention;

FIG. 2 illustrates a prior art bit line driver;

FIG. 3 is a block diagram of a prior art memory array;

FIG. 4 is a block diagram of a memory array of one embodiment of thepresent invention;

FIG. 5 illustrates a bit line and driver circuit of one embodiment ofthe present invention;

FIG. 6 is a block diagram of another memory array of one embodiment ofthe present invention;

FIG. 7 illustrates a block diagram of one embodiment of a basic disturbcircuit;

FIG. 8 illustrates a bit line and driver circuitry of an alternateembodiment of the present invention;

FIG. 9 illustrates a bit line and driver circuit of another embodimentof the present invention; and

FIG. 10 is a flow chart of an erase algorithm of an embodiment of thepresent invention.

DETAILED DESCRIPTION OF THE INVENTION

In the following detailed description of the preferred embodiments,reference is made to the accompanying drawings that form a part hereof,and in which is shown by way of illustration specific preferredembodiments in which the inventions may be practiced. These embodimentsare described in sufficient detail to enable those skilled in the art topractice the invention, and it is to be understood that otherembodiments may be utilized and that logical, mechanical and electricalchanges may be made without departing from the spirit and scope of thepresent invention. The following detailed description is, therefore, notto be taken in a limiting sense, and the scope of the present inventionis defined only by the claims.

FIG. 1 illustrates a block diagram of a flash memory device 100 that iscoupled to a controller 102. The memory device has been simplified tofocus on features of the memory that are helpful in understanding thepresent invention. The memory device includes an array of memory cells110. The memory cells are preferably floating gate memory cells, and thearray is arranged blocks of rows and columns. The blocks allow memorycells to be erased in large groups. Data, however, is stored in thememory array in small data groups (byte or group of bytes) and separatefrom the block structure. Erase operations are usually performed on alarge number of cells in parallel.

An x-decoder 112 and y-decoders 114, 118 are provided to decode addresssignals provided on address lines A0-Ax. Address signals are receivedand decoded to access the memory array. An address buffer circuit 116 isprovided to latch the address signals. A y-decoder circuit is providedto select a column of the array and includes a y-select circuit 118, anda y-mux 114. Sense amplifier and compare circuitry 120 is used to sensedata stored in the memory cells and verify the accuracy of stored data.Data driver circuitry 115 is provided at opposite ends of array 110, asexplained below, to efficiently drive data to bit lines of the array.

Data input and output buffer circuits 122 are included forbi-directional data communication over a plurality of data (DQ) lines124 with the processor. Command control circuit 130 decodes signalsprovided on control lines 131 from the processor. These signals are usedto control the operations of the memory, including data read, datawrite, and erase operations. A state machine(s) can be provided as partof the control circuitry to perform read, write and erase operations.The flash memory may include a charge pump circuit 132 that generates anelevated voltage, Vpp, used during programming of the memory cells andother internal operations. During write operations, Vpp is coupled tothe memory cells for providing appropriate write operation programmingpower. Charge pump designs are known to those skilled in the art, andprovide power which is dependant upon an externally provided supplyvoltage Vcc. Typically, a flash memory will include separate chargepumps to provide for different needs, such as charge pumps that generatea 12 volt and 5 volt supplies.

As stated above, the flash memory of FIG. 1 has been simplified tofacilitate a basic understanding of the features of the memory. Further,it will be appreciated that more than one flash memory can be includedin various package configurations. For example, flash memory cards canbe manufactured in varying densities using numerous flash memories.

FIG. 2 illustrates a portion of a prior memory array column, or bit line200. The bit line is coupled to numerous memory cell drain regions.Resistors 202 and 204 (Rbl) in FIG. 2 together represent the memory bitline resistance. During program operations, a bit line driver circuit210 is coupled to the bit line to provide a programming voltage. Asillustrated, a bit line driver circuit is coupled to one end of the bitline. To program a memory cell 220 located at an opposite end of the bitline, the bit line driver circuit must provide a voltage that accountsfor the bit line voltage drop. For example, the single bit line drivercircuit must provide a voltage (Vdriver) equal to the desired programvoltage (Vd) plus a bit line voltage drop (Vbl). The Vbl can be definedas the bit line resistance (Rbl) times the programming current (Ip). Inother words, Vdriver=Vd+(Rbl*Ip).

FIG. 3 illustrates a general block diagram of a prior art memory array300. The array is arranged with a plurality of address blocks310(1)-310(4) that share common bit lines 314 (only one is illustrated).A column decoder circuit 320 is coupled to the array and bit lines. Thedecoder couples column, or bit line, driver circuitry 330 to a selectedcolumn based on address signals. As explained above, the driver circuitmust provide a sufficient program voltage to program or erase memorycells at a remote end of the selected bit line.

During a typical erase operation, one of the blocks is selected, such as310(1). The un-selected blocks 310(2)-310(4) remain coupled to theselected bit line 314. As such, the un-selected blocks are subjected tothe erase voltage coupled to the selected bit line. This erase voltagecan disturb the memory cells in the un-selected blocks. In prior memorydevices, a time consuming process of checking the memory cells in theun-selected blocks was performed to identify cells that required repair.One embodiment of the present invention provides disturb test rows inthe array to estimate a disturb condition of the memory array.

FIG. 4 illustrates an array 400 of one embodiment of the presentinvention having a pair of disturb test rows 410. test rows 410 haveseparate source and word lines from other blocks 420. The test rows arelocated close to the bit line driver circuitry 445 so that they aresubjected to the highest bit line voltage during erase/programoperations. This location increases the probability that a memory cellwill be disturbed in the test rows first. Further, having both an evenand an odd test row in the pair of test rows increases the reliabilityof a disturb test in the case where one of the rows, typically a mirrorimage of the other, is more sensitive to disturb. Test rows, as definedherein, are specific addressable groups or blocks of memory cells thatare used for test purposes. They are not accessible for standard programand read operations. That is, the test rows are not externallyaddressable for programming and reading. The test rows, however, can beused as dummy rows (rows whose main purpose is to improve the uniformityof the array) as long as the test rows sources are separate from theselected array sources. Common bit lines 430 (only one illustrates) arecoupled to memory arrays blocks 420(1)-420(4) and the pair of disturbtest rows 410. Column decode circuitry 440 is used to couple the drivercircuitry 445 to a selected column in response to address signals.During manufacturing all cells in the disturb rows are programmed sothat they can be disturbed. These cells are never intentionally erased.

A disturb test can be conducted on the test rows as part of an eraseoperation. That is, the test rows can be read using a relatively lowword line voltage following erasure of memory cells in the array. If thelow word line voltage activates a memory cell in one or more of the testrows, the memory cell(s) has been disturbed. The control gate voltagelevel used on the test row word lines can be adjusted to be moresensitive to disturb conditions. That is, the voltage level provided onthe control gates can be reduced from a normal operating level to checkfor disturb conditions. Alternatively, a reference current used tocompare to a bit line current from the disturb rows can be adjusted todetect smaller disturb conditions.

Referring to FIG. 5, a portion of a memory array column of oneembodiment the present invention is illustrated. Bit line 500 is coupledto numerous non-volatile memory cells 510(1)-510(n), such as floatinggate memory cells. The bit line can be fabricated using either aconductive or semi-conductive material. For example, the bit line can befabricated using an aluminum or copper alloy, or a polysilicon material.The bit line is typically fabricated in a symmetrical manner andtherefore has a uniform distributed resistance. Resistors 520 and 522(Rbl) in FIG. 5 represent the memory bit line resistance.

A pair of bit line driver circuits 530 and 540 are coupled to the bitline. Each one of the driver circuits is coupled to an opposite endregion of the bit line 500. As such, all of the memory cells of bit lineare located within one-half of the bit line resistance, Rbl, to a bitline driver. A memory cell 510(2) located in the center of a bit linedefines the required voltage of the driver circuits, Vdriver. The bitline resistance from the driver to the memory cell is half of Rbl,Vdriver=Vd+(Rbl/2*Ip). If the bit line is driven from both ends, theequivalent resistance becomes Rbl/2 twice in parallel, therefore Rbl/4.As a result, Vdriver=Vd+Rbl/4*Ip. Thus, the voltage supplied by bothdriver circuits can be reduced compared to a single driverconfiguration.

In an alternate embodiment, the driver circuits 530 and 540 can bedistributed along the bit line and not limited to end region locations,see FIG. 8. Likewise, additional driver circuits can be distributedalong the bit lines to further reduce the driver voltage requirement.For example, a bit line having a resistance of R is coupled to thenon-volatile memory cells, and X distributed driver circuits are coupledto the bit line. A resistance between each of the non-volatile memorycells and any of the driver circuits is less than R/X. With drivercircuits at both ends and distributed drivers, the resistance betweeneach of the non-volatile memory cells and any one of the driver circuitsis less than R/2(X−1). An equivalent resistance between any memory celland all of the bit line driver circuits is less than R/4(X−1). That is,by activating all of the distributed driver circuits reduces theequivalent resistance to all of the memory cells, including theworst-case memory cell. See FIG. 9 for a memory that uses threedistributed driver circuits 530, 535 and 540.

The bit line driver circuits are selectively activated using decodercircuitry 560. The decoder circuitry activates one or more drivercircuits based upon address signals provided by the externalprocessor/controller 102. In one embodiment, all drivers are activatedduring a write operation on a selected bit line. In another embodiment,one of the driver circuits is activated based on its location relativeto a selected row of the memory array. That is, driver 540 is activatedto program any memory cells located in the bottom half of the bit line,and driver 530 is activated to program any memory cells located in thetop half of the bit line. Unused driver circuits are placed in atri-state condition. It will be appreciated that activating both driversat the same time decreases the equivalent resistance to a given cell toRbl/4 or less and simplifies the decode circuitry. The decoder circuit,in either embodiment, selectively activates the driver circuit(s) inresponse to address signals provided on external address connections.Multiple test rows are located close to the bit line driver circuits, asillustrated in FIG. 6. Providing multiple test locations close to thedrivers keeps the test rows subjected to the highest bit line erasevoltages. Only one of the test row pairs need to be tested during eraseoperations. That is, the test rows located closest to the activateddriver are tested for disturb.

FIG. 6 illustrates an array 600 of one embodiment of the presentinvention having two pairs of disturb test rows 610 and 620. The testrows are located at opposite ends of the array and close to the bit linedriver circuits 665 and 670 so that they are subjected to the highestbit line voltage during program operations. This location increases theprobability that a memory cell will be disturbed in the test rows first.Further, having both an even and an odd test row in the pair of testrows increases the reliability of a disturb test. Test rows, as definedherein, are specific addressable groups or blocks of memory cells thatare used for test purposes. They are not accessible for standard programand read operations. That is, the test rows are not externallyaddressable for programming and reading. The test rows, however, can beused as dummy rows. Column decoder circuitry is illustrated as twocomponents 650 and 660.

The bit line driver circuits are selectively activated/coupled using thedecoder circuitry. The decoder circuitry activates one or both drivercircuits based upon the address signals provided by an externalprocessor. In one embodiment, both drivers are activated during a writeoperation on a selected bit line. In another embodiment, the one of thedriver circuits is activated based on its location relative to aselected row of the memory array.

Because the memory cells in the test row are never erased, they willexperience the longest disturb time during program and erase operationsof any memory cell in the array. These cells are only programmed ifleakage has been detected.

FIG. 7 illustrates a block diagram of one embodiment of a basic disturbcircuit 700 that can be used to look for a disturb condition in the testrows, such as rows 410. The disturb circuit has one input 702 coupled tothe bit line, and either one or two reference current inputs 704. Theverify circuit 700 includes at least one comparator circuit 710 that iscoupled to the bit lines while the memory cells of the test rows areread. The comparator determines if a drain current of the test rowmemory cell are in an acceptable range or exceeds a predeterminedthreshold current. If the output of the disturb circuitry indicates thata disturb condition has been detected, corrective action can be taken tomaintain the integrity of the data in the remaining memory array. Forexample, a data recovery operation can be performed on the memory cellslocated in the memory array blocks that were not erased.

Referring to FIG. 10, a flow chart of an erase algorithm 800 of anembodiment of the present invention. The erase operation starts with aprior art erase pre-program operation 802. This operation pre-programsthe cells to help reduce over-erasure. Erase pulses and verification 804are performed as known to those skilled in the art. Likewise, prior artheal operations 806 can be performed to recover over-erased cells.Following the heal operation, the memory control accesses the firstlocation in the test rows, 810. The test row words are verified 812 todetermine if the data is “0”. If the data is “0”, the address isincremented 814 and the word verification continues until the final testrow location is reached 816. If any of the data is not a “0”, a disturbcondition has been detected 820. In response to the disturb detection,all arrays and test rows are verified and disturbed bits arere-programmed. One example of this recovery operation is described inU.S. Pat. No. 6,108,241.

CONCLUSION

A non-volatile memory device has been described that has an array ofmemory cells arranged in rows and columns. The memory cells can beexternally accessed for programming, erasing and reading operations.Test rows of memory cells are provided in the array to allow for memorycell disturb conditions. The test rows are not externally accessible forstandard program and read operations. The test rows are located near bitline driver circuitry to insure the highest exposure to bit linevoltages that may disturb memory cells in the array.

Although specific embodiments have been illustrated and describedherein, it will be appreciated by those of ordinary skill in the artthat any arrangement, which is calculated to achieve the same purpose,may be substituted for the specific embodiment shown. This applicationis intended to cover any adaptations or variations of the presentinvention. Therefore, it is manifestly intended that this invention belimited only by the claims and the equivalents thereof.

What is claimed is:
 1. A non-volatile memory device comprising: an arrayof reprogrammable non-volatile memory cells arranged in rows andcolumns; a plurality of bit lines coupled to the non-volatile memorycells; a driver circuit coupled to the plurality of bit lines; and testrows coupled to the array, wherein the driver circuit comprises firstand second bit line drivers located at opposite ends of the array rows,and the test rows comprise first and second pairs of test rowsrespectively located adjacent to the first and second bit line drivers.2. The non-volatile memory device of claim 1 wherein the non-volatilememory cells are floating gate transistors.
 3. A flash memory devicecomprising: an array of floating gate non-volatile memory cells arrangedin rows and columns; a bit line coupled to the non-volatile memorycells; first and second driver circuits respectively coupled to firstand second end regions of the bit line; a decoder circuit to selectivelycouple the first and second driver circuits to the bit line; and firstand second sets of addressable memory cell test rows coupled to thearray and respectively located near the first and second drivercircuits.
 4. The flash memory device of claim 3 wherein the first andsecond sets of addressable test rows each comprise two test rows.
 5. Theflash memory device of claim 3 further comprising a disturb test circuitto determine if the memory cells of the first and second sets ofaddressable memory cell test rows have been disturbed.
 6. A non-volatilememory device comprising: an array of non-volatile memory cells arrangedin rows and columns; a bit line having a resistance of R and coupled tothe non-volatile memory cells; X distributed driver circuits coupled tothe bit line; and X pairs of addressable test rows coupled to the arrayand respectively located near the X driver circuits, wherein X equalstwo and the two pairs of addressable test rows are located at oppositeends of the bit line.
 7. A method of erasing memory cells in anon-volatile memory device comprising: initiating an erase operation onmemory cells located in a first part of an addressable array of memorycells; and performing a disturb test operation on test rows to forecasta lack of memory cell disturb during the erase operation of memory cellslocated in a second part of the addressable array.
 8. The method ofclaim 7 wherein performing the disturb test operation comprises:coupling a predefined word line voltage to memory cells located in thetest rows; and determining if the memory cells located in the test rowsare activated in response to the predefined word line voltage.
 9. Themethod of claim 7 further comprises performing a data recovery operationon the memory cells located in the second part of the addressable arraybased upon the disturb test operation on the test rows.
 10. The methodof claim 7 further comprises performing a data recovery operation on thememory cells located in the test rows based upon the disturb testoperation on the test rows.
 11. The method of claim 7 wherein the testrows comprise two test rows located on an edge of addressable array ofmemory cells.
 12. The method of claim 7 wherein the memory cells arefloating gate transistor memory cells.
 13. The method of claim 7 furthercomprising: locating the test rows near at least one driver circuit. 14.A method of operating a non-volatile memory device comprising:initiating an erase operation on a first erase block of memory cellslocated in an addressable array of memory cells, wherein the array has Xerase blocks; and performing a disturb test operation on test rows toforecast a lack of memory cell disturb during the erase operation ofmemory cells located in remaining X−1 erasable blocks, wherein the testrows are not located within the X erase blocks.
 15. The method of claim14 wherein the test rows comprise two test rows located on an edge ofthe X erase blocks.
 16. The method of claim 14 further comprisesperforming a data recovery operation on the remaining X−1 erasableblocks based upon the disturb test operation on the test rows.
 17. Themethod of claim 14 wherein the memory cells are floating gate transistormemory cells.
 18. The method of claim 14 further comprising: locatingthe test rows near at least one driver circuit.
 19. A method ofoperating a non-volatile memory system comprising: initiating an eraseoperation on memory cells located in a first block of an array of memorycells of a memory device in response to instructions from an externalprocessor; performing a disturb test operation on test rows to forecasta lack of memory cell disturb during the erase operation or a prioroperation of memory cells located in additional blocks of the array; andperforming a data recovery operation on the memory cells located in theadditional blocks of the array based upon the disturb test operation.20. The method of claim 19 wherein the test rows comprise two test rowslocated on an edge of the array of memory cells.
 21. The method of claim19 wherein the memory cells are floating gate transistor memory cells.22. The method of claim 19 further comprising: locating the test rowsnear at least one driver circuit.
 23. A memory system comprising: aprocessor; and a non-volatile memory device coupled to the processor andcomprising, an array of floating gate non-volatile memory cells arrangedin rows and columns, a bit line coupled to the non-volatile memorycells, first and second driver circuits respectively coupled to firstand second end regions of the bit line, a decoder circuit to selectivelycouple the first and second driver circuits to the bit line, and firstand second sets of addressable memory cell test rows coupled to thearray and respectively located near the first and second drivercircuits.
 24. The memory system of claim 23 wherein the first and secondsets of addressable test rows each comprise two test rows.
 25. Thememory system of claim 23 further comprising a disturb test circuitcoupled to the test rows to determine if the memory cells of the firstand second sets of addressable memory cell test rows have beendisturbed.
 26. A memory device comprising: an array of memory cellsarranged in rows and columns; a plurality of bit lines coupled to thememory cells; a first and second driver circuits electrically coupleableto the plurality of bit lines; and first and second sets of test rowscoupled to the array and respectively located near the first and seconddriver circuits, wherein the first and second driver circuits arelocated at opposite ends of the plurality of bit lines.
 27. A memorydevice comprising: an array of reprogrammable memory cells arranged inrows and columns; a plurality of bit lines coupled to the memory cells;a first and second driver circuits electrically coupleable to theplurality of bit lines; first and second sets of test rows coupled tothe array and respectively located near the first and second drivercircuits; and wherein the first and second driver circuits are activatedsimultaneously to drive data on the plurality of bit lines.
 28. A memorydevice comprising: an array of reprogrammable memory cells arranged inrows and columns; a plurality of bit lines coupled to the memory cells;a first and second driver circuits electrically coupleable to theplurality of bit lines; first and second sets of test rows coupled tothe array and respectively located near the first and second drivercircuits; and wherein the first and second driver circuits areindependently activated to drive data on the plurality of bit lines. 29.A memory device comprising: an array of memory cells arranged in rowsand columns; a plurality of bit lines coupled to the memory cells; afirst and second driver circuits electrically coupleable to theplurality of bit lines; and first and second sets of test rows coupledto the array and respectively located near the first and second drivercircuits, wherein the first and second driver circuits are independentlyactivated to drive data on the plurality of bit lines and wherein anun-activated driver circuit is placed in a tri-state condition.
 30. Amemory device comprising: an array of memory cells arranged in rows andcolumns; a plurality of bit lines coupled to the memory cells; a firstand second driver circuits electrically coupleable to the plurality ofbit lines; and first and second sets of test rows coupled to the arrayand respectively located near the first and second driver circuits,further comprising a disturb circuit coupled to the first and secondsets of test rows to determine if the memory cells of the first andsecond sets of addressable memory cell test rows have been disturbed.31. A memory device comprising: an array of reprogrammable memory cellsarranged in rows and columns; a plurality of bit lines coupled to thememory cells; a first and second driver circuits electrically coupleableto the plurality of bit lines; first and second sets of test rowscoupled to the array and respectively located near the first and seconddriver circuits; a third driver circuit electrically coupleable to theplurality of bit lines; and a third set of test rows coupled to thearray and respectively located near the third driver circuit.
 32. Anon-volatile memory device comprising: an array of non-volatile memorycells arranged in rows and columns; a plurality of bit lines coupled tothe non-volatile memory cells; a driver circuit coupled to the pluralityof bit lines; test rows coupled to the array and located near the drivercircuit; and a disturb test circuit to determine if the memory cells ofthe test rows have been disturbed.
 33. A flash memory device comprising:an array of floating gate non-volatile memory cells arranged in rows andcolumns; a bit line coupled to the non-volatile memory cells; first andsecond driver circuits respectively coupled to first and second endregions of the bit line; a decoder circuit to selectively couple thefirst and second driver circuits to the bit line; first and second setsof addressable memory cell test rows coupled to the array andrespectively located near the first and second driver circuits; and adisturb test circuit to determine if the memory cells of the first andsecond sets of addressable memory cell test rows have been disturbed.34. A non-volatile memory device comprising: an array of non-volatilememory cells arranged in rows and columns; a bit line having aresistance of R and coupled to the non-volatile memory cells; Xdistributed driver circuits coupled to the bit line; X pairs ofaddressable test rows coupled to the array and respectively located nearthe X driver circuits; and a disturb test circuit to determine if thememory cells of the X pairs of addressable test rows have beendisturbed.